VLSI Test Principles and Architectures Design for Testability (Record no. 56465)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00323nam a2200121Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9789380501550 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Laung- Terng Wang |
| 245 ## - TITLE STATEMENT | |
| Title | VLSI Test Principles and Architectures Design for Testability |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Date of publication, distribution, etc. | 2011 |
| Name of publisher, distributor, etc. | ELSEVIER |
| Place of publication, distribution, etc. | London |
| 300 ## - PHYSICAL DESCRIPTION | |
| Page | xxx+777 |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Cheng-Wen Wu |
| -- | Xiaoqing Wen |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | BOOK BANK |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Cost, normal purchase price | Full call number | Barcode | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|
| NSS COLLEGE OF ENGINEERING | NSS COLLEGE OF ENGINEERING | BOOK BANK STACK AREA | 03/28/2015 | 0.00 | 621.395 WAN/V | 56020 | BOOK BANK |